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expert.gif (10796 bytes)NEW FEATURE !
EXPERT CLINICS

Interactive sessions led by foremost metrics experts. Receive drill-downs, troubleshooting, and specific recommendations to improve your metrics program. [more info]

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Featuring renowned experts:
Arthur M. Schneiderman KEYNOTE
Arthur M. Schneiderman
Former Vice President of Quality and Productivity Improvement at Analog Devices
Anthony Davila KEYNOTE
Anthony Davila
Stanford University Graduate School of Business
Jay Andersen Jay Andersen
Eli Lilly & Company
Dr. Richard Bingham Dr. Richard Bingham
DuPont
Mike Brennan Mike Brennan
Brennan Consulting
John Cordes John Cordes
National Semiconductor
Peter Dierauer Peter Dierauer
Honeywell Embedded Controls
Arthur Schneiderman Mitch Duckler
Kuczmarski & Associates
Bradford L. Goldense Bradford L. Goldense
Goldense Group, Inc.
Curtis Hargadine Curtis Hargadine
Development Professionals, Inc.
Thomas Kuczmarski Thomas Kuczmarski
Kuczmarski & Associates
Wayne Mackey Wayne Mackey
Product Development Consulting, Inc.
Jerry McColgin Jerry McColgin
McColgin Consulting
Brian Montgomery Brian Montgomery
Blackbaud, Inc.
Tim Paul Tim Paul
Kuczmarski & Associates
Eduardo Sao Clemente Eduardo Sao Clemente
McColgin Consulting
Les Stewart Les Stewart
Medrad
Michael Bessette
Rogers Corporation
Paul Falkenstein
Becton Dickinson
Thomas Gregory
3M

Publication Sponsor:Sloan Management Review

 

Affiliate Organization:PMI Registered Education Provider


R&D Metrics Indicator NewsletterSign up now for your FREE subscription to MRT's new periodical focused on measuring product development and R&D performance.  [More Info]

Resource and Capacity Management Survey
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